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JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working
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JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

Inventory # CONF-1136

  • Part No: SIP CONTROL
  • Model No: SIP/BAKEOUT POWER SUPPLY
  • Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System

    This JEOL SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 63 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 31


    Listed with ExportYourStore.com
    $332.46

    Original: $1,108.19

    -70%
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

    $1,108.19

    $332.46

    More Images

    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 2
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 3
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 4
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 5
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 6
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 7
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 8
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 9
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 10
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 11
    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working - Image 12

    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

    Inventory # CONF-1136

  • Part No: SIP CONTROL
  • Model No: SIP/BAKEOUT POWER SUPPLY
  • Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System

    This JEOL SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 63 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 31


    Listed with ExportYourStore.com

    Product Information

    Shipping & Returns

    Description

    JEOL SIP Control SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect SEM Working

    Inventory # CONF-1136

  • Part No: SIP CONTROL
  • Model No: SIP/BAKEOUT POWER SUPPLY
  • Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System

    This JEOL SIP/BAKEOUT Power Supply JWS-7555S Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 63 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 31


    Listed with ExportYourStore.com