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FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used
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FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used

FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used

FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used

Inventory # A-14003

  • Part No: 4022.192.70072
  • Model No: MOB 7007
  • Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System

    This FEI Company 4022.192.70072 Processor PCB Card is used working surplus. Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 4 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 30


    Listed with ExportYourStore.com
    $304.19
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used
    $304.19

    More Images

    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 2
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 3
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 4
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 5
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 6
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 7
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 8
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 9
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 10
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 11
    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used - Image 12

    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used

    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used

    Inventory # A-14003

  • Part No: 4022.192.70072
  • Model No: MOB 7007
  • Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System

    This FEI Company 4022.192.70072 Processor PCB Card is used working surplus. Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 4 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 30


    Listed with ExportYourStore.com

    Product Information

    Shipping & Returns

    Description

    FEI Company 4022.192.70072 Processor PCB Card MOB 7007 XL 830 FIB-SEM Used

    Inventory # A-14003

  • Part No: 4022.192.70072
  • Model No: MOB 7007
  • Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System

    This FEI Company 4022.192.70072 Processor PCB Card is used working surplus. Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.

  • Sale Details

    • Item Condition: Used Working, 90 Day Warranty
    • Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 4 lbs.
    • Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
    • For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
    • Items are sold with a 90-Day Satisfaction Guarantee

      Lister 30


    Listed with ExportYourStore.com